LAP LAMBERT Academic Publishing

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Обложка Hazard Assessment of E-Waste From Desktop Computers
Omni badge Hazard Assessment of E-Waste From Desktop Computers

TCLP Indicates E-Waste Should be Managed as Hazardous Waste

Строительство и экологические технологии

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-6966-2

286.65 R$
Обложка The complexity of punitiveness of electronically monitored sanctions
Omni badge The complexity of punitiveness of electronically monitored sanctions

The western world''s analysis

Социальная педагогика, социальная работа

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-7121-4

397.80 R$
Обложка Collaborative Attacks on MANETs
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An Analysis of Collaborative Attacks on Mobile Ad hoc Networks

Обмен данными, сети

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-6975-4

286.65 R$
Обложка Groundwater Nitrate
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Transport, Attenuation and Phytoremediation

Строительство и экологические технологии

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-6983-9

462.15 R$
Обложка RNA interference: An antiviral therapy for White spot syndrome virus
Omni badge RNA interference: An antiviral therapy for White spot syndrome virus

An update

Биохимия, биофизика

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-6551-0

462.15 R$
Обложка Automatic Segmentation of White Matter Lesions from MRI Data
Omni badge Automatic Segmentation of White Matter Lesions from MRI Data Информатика, ИТ

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-7643-1

286.65 R$
Обложка Service Quality Dimensions
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An Empirical Study in Banking Industry

Реклама, маркетинг

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-7284-6

462.15 R$
Обложка OIL VIOLENCE IN NIGERIA
Omni badge OIL VIOLENCE IN NIGERIA

CHECKMATING ITS RESURGENCE IN THE NIGER DELTA

Общие социальные науки

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-7168-9

462.15 R$
Обложка Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics
Omni badge Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics

Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs

Электроника, электротехника, коммуникационные технологии

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-6404-9

462.15 R$
Обложка The Match
Omni badge The Match

Football and the BBC, 1937-82

Медиа Науки

LAP LAMBERT Academic Publishing (2010-06-22) - ISBN-13: 978-3-8383-7057-6

462.15 R$

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