金琅学术出版社

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Omni badge Hot Carrier Degradation in CMOS LC Injection-Locked Frequency Dividers

RF Performance of CMOS LC Injection-locked Frequency Dividers Under Over-voltage Operation

Electronics, electro-technology, communications technology

金琅学术出版社 (2016-03-16) - ISBN-13: 978-3-639-82345-5

842.76 NT$
Omni badge 小型天然气液化装置 Other

金琅学术出版社 (2016-03-15) - ISBN-13: 978-3-639-82392-9

913.58 NT$

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